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Nuclear Reaction Analysis of Materials using MeV Ion Beams

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dc.contributor.authorCarvalho, José Pacheco de
dc.contributor.authorPacheco, Cláudia Ribeiro
dc.contributor.authorReis, Antonio
dc.date.accessioned2019-10-24T15:57:17Z
dc.date.available2019-10-24T15:57:17Z
dc.date.issued2017
dc.description.abstractThis article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method is successfully applied to depth profiling of light nuclei e. g. 12C and 18O in thick targets, using deuteron and proton induced reactions, respectively. Scanning electron microscopy is used as a complementary technique, to give information about surface topography.pt_PT
dc.description.sponsorshipUniversity of Beira Interiorpt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.urihttp://hdl.handle.net/10400.6/7384
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherSociedade Portuguesa de Materriaispt_PT
dc.subjectSurface Analysispt_PT
dc.subjectComputer Simulationpt_PT
dc.subjectNuclear techniquespt_PT
dc.subjectNuclear reactionspt_PT
dc.subjectDepth profilingpt_PT
dc.titleNuclear Reaction Analysis of Materials using MeV Ion Beamspt_PT
dc.typeconference object
dspace.entity.typePublication
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/5876/PEst-OE%2FFIS%2FUI0524%2F2014/PT
oaire.citation.conferencePlaceUniversidade de Aveiro, Aveiro, Portugalpt_PT
oaire.citation.endPage339pt_PT
oaire.citation.startPage339pt_PT
oaire.citation.titleMateriais 2017- VIII International Materials Symposiumpt_PT
oaire.fundingStream5876
person.familyNamePacheco de Carvalho
person.familyNameRibeiro Pacheco
person.familyNameReis
person.givenNameJose
person.givenNameClaudia
person.givenNameAntonio
person.identifier.orcid0000-0002-8822-9146
person.identifier.orcid0000-0002-7375-7392
person.identifier.orcid0000-0002-0538-3392
person.identifier.scopus-author-id56017281000
person.identifier.scopus-author-id24765258500
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.nameFundação para a Ciência e a Tecnologia
rcaap.rightsopenAccesspt_PT
rcaap.typeconferenceObjectpt_PT
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