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Surface Analysis of Materials by Elastic Scattering of MeV Ions

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dc.contributor.authorCarvalho, José Pacheco de
dc.contributor.authorPacheco, Cláudia Ribeiro
dc.contributor.authorReis, Antonio
dc.date.accessioned2019-10-24T15:36:27Z
dc.date.available2019-10-24T15:36:27Z
dc.date.issued2017
dc.description.abstractAbstract—This article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method, using elastic scattering of (4He)+ ions, is successfully applied to depth profiling in a target containing a thin film deposited on a thick substrate and in a thick target.pt_PT
dc.description.sponsorshipUniversity of Beira Interiorpt_PT
dc.description.versioninfo:eu-repo/semantics/publishedVersionpt_PT
dc.identifier.urihttp://hdl.handle.net/10400.6/7382
dc.language.isoengpt_PT
dc.peerreviewedyespt_PT
dc.publisherSociedade Portuguesa de Materiaispt_PT
dc.subjectSurface analysispt_PT
dc.subjectComputer Simulationpt_PT
dc.subjectNuclear techniquespt_PT
dc.subjectElastic Scatteringpt_PT
dc.subjectDepth profilingpt_PT
dc.titleSurface Analysis of Materials by Elastic Scattering of MeV Ionspt_PT
dc.typeconference object
dspace.entity.typePublication
oaire.awardURIinfo:eu-repo/grantAgreement/FCT/5876/PEst-OE%2FFIS%2FUI0524%2F2014/PT
oaire.citation.conferencePlaceAveiropt_PT
oaire.citation.endPage338pt_PT
oaire.citation.startPage338pt_PT
oaire.citation.titleMateriais 2017- VIII International Materials Symposiumpt_PT
oaire.fundingStream5876
person.familyNamePacheco de Carvalho
person.familyNameRibeiro Pacheco
person.familyNameReis
person.givenNameJose
person.givenNameClaudia
person.givenNameAntonio
person.identifier.orcid0000-0002-8822-9146
person.identifier.orcid0000-0002-7375-7392
person.identifier.orcid0000-0002-0538-3392
person.identifier.scopus-author-id56017281000
person.identifier.scopus-author-id24765258500
project.funder.identifierhttp://doi.org/10.13039/501100001871
project.funder.nameFundação para a Ciência e a Tecnologia
rcaap.rightsopenAccesspt_PT
rcaap.typeconferenceObjectpt_PT
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