Surface Analysis of Thick Targets by Nuclear Techniques

Carvalho, José Pacheco De; Pacheco, Cláudia Ribeiro; Reis, António

http://hdl.handle.net/10400.6/12426

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Authors

Carvalho, José Pacheco De

Pacheco, Cláudia Ribeiro

Reis, António

Abstract(s)

This article is about computer simulation for surface analysis through nuclear techniques, which are non-destructive. The energy analysis method is used. Energy spectra are computer simulated and compared to experimental data, giving sample composition and concentration profiles. The method is successfully applied to depth profiling of 12C nuclei in a thick target, using the 12C(d,p0)13C deuteron induced reaction. Elastic scattering permitted depth profiling of Al and O in a thick target. Scanning electron microscopy is used as a complementary technique, to give information about surface topography.

Keywords

Surface analysis Computer simulation Nuclear techniques Nuclear reactions Elastic scattering Depth profiling

URI

http://hdl.handle.net/10400.6/12426

Citation

José A. R. Pacheco de Carvalho, Cláudia F. F. P. Ribeiro Pacheco, A. D. Reis, ” Surface Analysis of Thick Targets by Nuclear Techniques”, Proc. Física2022-23ª Conferência Nacional de Física e 32º Encontro Ibérico para o Ensino da Física, p.164, Faculdade de Ciências da Universidade do Porto, Porto, Portugal, 7 a 10 de Setembro de 2022.